Hi, I've been reading your ICCAD paper "Duplex: Simultaneous Parameter-Performance Exploration for Optimizing Analog Circuits" and I have one question.
It seems that Duplex needs to "unifomly sample from the goal region" where the goal region is the desired performance region with all constraints satisfied. However, the goal region may not be a close space, which make it impossible to sample.
For example, you may have spec like "DC gain > 30dB" (Spec in Table 1 of the ICCAD paper), in that case, you only have a lower bound for DC gain but don't have an upper bound.
In that case, how can samples drawn from the goal region?
Hi, I've been reading your ICCAD paper "Duplex: Simultaneous Parameter-Performance Exploration for Optimizing Analog Circuits" and I have one question.
It seems that Duplex needs to "unifomly sample from the goal region" where the goal region is the desired performance region with all constraints satisfied. However, the goal region may not be a close space, which make it impossible to sample.
For example, you may have spec like "DC gain > 30dB" (Spec in Table 1 of the ICCAD paper), in that case, you only have a lower bound for DC gain but don't have an upper bound.
In that case, how can samples drawn from the goal region?